Tailoring threshold voltage of R2R printed SWCNT thin film transistors for realizing 4 bit ALU

Autor: Sajjan Parajuli, Younsu Jung, Sagar Shrestha, Jinhwa Park, Chanyeop Ahn, Kiran Shrestha, Bijendra Bishow Maskey, Tae-Yeon Cho, Ji-Ho Eom, Changwoo Lee, Jeong-Taek Kong, Byung-Sung Kim, Taik-Min Lee, SoYoung Kim, Gyoujin Cho
Jazyk: angličtina
Rok vydání: 2024
Předmět:
Zdroj: npj Flexible Electronics, Vol 8, Iss 1, Pp 1-11 (2024)
Druh dokumentu: article
ISSN: 2397-4621
DOI: 10.1038/s41528-024-00369-1
Popis: Abstract Despite the roll-to-roll (R2R) gravure printing method emerging as an alternative sustainable technology for fabricating logic circuits based on p- and n-types of single-walled carbon nanotube thin film transistors (p,n-SWCNT-TFTs), the wide variation of large threshold voltage (V th > ~8) in the R2R printed p,n-SWCNT-TFTs prevents the integration of complementary logic circuit. Here, the V th variation of the p,n-SWCNT-TFTs was narrowed down by developing a method of using the first gravure roll with the minimized superposition error (
Databáze: Directory of Open Access Journals