1/f noise and carrier transport mechanisms in InSb p + -n junctions

Autor: V.V. Tetyorkin, A.V. Sukach, A.I. Tkachuk, S.P. Trotsenko
Jazyk: angličtina
Rok vydání: 2018
Předmět:
Zdroj: Semiconductor Physics, Quantum Electronics & Optoelectronics, Vol 21, Iss 4, Pp 374-379 (2018)
Druh dokumentu: article
ISSN: 1560-8034
1605-6582
DOI: 10.15407/spqeo21.04.374
Popis: The dark current and 1/f noise spectra have been investigated in p + -n InSb junctions. The photodiodes were prepared by Cd diffusion into single crystal substrates. The current-voltage characteristics have been explained within a model of inhomogeneous p-n junction. The junction inhomogeneities are caused by dislocations crossing the depletion region. The correlation between the trap-assisted tunneling current through the local inhomogeneous regions of the junction and 1/f noise has been shown to exist. The fluctuations of the junction resistance have been argued to be responsible for the origin of 1/f noise.
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