Broad-spectrum resistance to fungal foliar diseases in wheat: recent efforts and achievements

Autor: Amira M. I. Mourad, Asmaa A. M. Ahmed, P. Stephen Baenziger, Andreas Börner, Ahmed Sallam
Jazyk: angličtina
Rok vydání: 2024
Předmět:
Zdroj: Frontiers in Plant Science, Vol 15 (2024)
Druh dokumentu: article
ISSN: 1664-462X
DOI: 10.3389/fpls.2024.1516317
Popis: Wheat (Triticum spp.) is one of the most important cereal crops in the world. Several diseases affect wheat production and can cause 20-80% yield loss annually. Out of these diseases, stripe rust, also known as yellow rust (Puccinia striiformis f. sp. tritici), stem rust (Puccinia graminis f. sp. tritici), leaf rust (Puccinia recondita), and powdery mildew (Blumeria graminis f. sp. tritici) are the most important fungal diseases that infect the foliar part of the plant. Many efforts were made to improve wheat resistance to these diseases. Due to the continuous advancement in sequencing methods and genomic tools, genome-wide association study has become available worldwide. This analysis enabled wheat breeders to detect genomic regions controlling the resistance in specific countries. In this review, molecular markers significantly associated with the resistance of the mentioned foliar diseases in the last five years were reviewed. Common markers that control broad-spectrum resistance in different countries were identified. Furthermore, common genes controlling the resistance of more than one of these foliar diseases were identified. The importance of these genes, their functional annotation, and the potential for gene enrichment are discussed. This review will be valuable to wheat breeders in producing genotypes with broad-spectrum resistance by applying genomic selection for the target common markers and associated genes.
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