Autor: |
Savio Fabretti, Inga-Mareen Imort, Timo Kuschel, Thomas Dahm, Veerendra K. Guduru, Uli Zeitler, Andy Thomas |
Jazyk: |
angličtina |
Rok vydání: |
2014 |
Předmět: |
|
Zdroj: |
AIP Advances, Vol 4, Iss 3, Pp 037115-037115-6 (2014) |
Druh dokumentu: |
article |
ISSN: |
2158-3226 |
DOI: |
10.1063/1.4869291 |
Popis: |
We investigated the magnetic anisotropy ratio of thin sputtered polycrystalline MgB2 films on MgO substrates. Using high magnetic field measurements, we estimated an anisotropy ratio of 1.35 for T = 0 K with an upper critical field of 31.74 T in the parallel case and 23.5 T in the perpendicular case. Direct measurements of a magnetic-field sweep at 4.2 K show a linear behavior, confirmed by a linear fit for magnetic fields perpendicular to the film plane. Furthermore, we observed a change of up to 12% of the anisotropy ratio in dependence of the film thickness. |
Databáze: |
Directory of Open Access Journals |
Externí odkaz: |
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