Nanoscale Characterization of Graphene Oxide-Based Epoxy Nanocomposite Using Inverted Scanning Microwave Microscopy

Autor: C. H. Joseph, Francesca Luzi, S. N. Afifa Azman, Pietro Forcellese, Eleonora Pavoni, Gianluca Fabi, Davide Mencarelli, Serena Gentili, Luca Pierantoni, Antonio Morini, Michela Simoncini, Tiziano Bellezze, Valeria Corinaldesi, Marco Farina
Jazyk: angličtina
Rok vydání: 2022
Předmět:
Zdroj: Sensors, Vol 22, Iss 24, p 9608 (2022)
Druh dokumentu: article
ISSN: 1424-8220
68127456
DOI: 10.3390/s22249608
Popis: Scanning microwave microscopy (SMM) is a novel metrological tool that advances the quantitative, nanometric, high-frequency, electrical characterization of a broad range of materials of technological importance. In this work, we report an inverted near-field scanning microwave microscopy (iSMM) investigation of a graphene oxide-based epoxy nanocomposite material at a nanoscopic level. The high-resolution spatial mapping of local conductance provides a quantitative analysis of the sample’s electrical properties. In particular, the electrical conductivity in the order of ∼10−1 S/m as well as the mapping of the dielectric constant with a value of ∼4.7 ± 0.2 are reported and validated by the full-wave electromagnetic modeling of the tip–sample interaction.
Databáze: Directory of Open Access Journals
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