Monitoring of the morphologic reconstruction of deposited ablation products in laser irradiation of silicon

Autor: Vlasova M., Aguilar Márquez P.A., Reséndiz-González M.C., Kakazey M., Stetsenko V., Tomila T., Ragulya A.
Jazyk: angličtina
Rok vydání: 2008
Předmět:
Zdroj: Science of Sintering, Vol 40, Iss 1, Pp 69-78 (2008)
Druh dokumentu: article
ISSN: 0350-820X
DOI: 10.2298/SOS0801069V
Popis: Using electron microscopy, atomic force microscopy, X-ray microanalysis, and IR spectroscopy, it was established that, in the regime of continuous laser irradiation of silicon at P = 170 W in different gaseous atmospheres with an oxygen impurity, SiOx composite films with a complex morphology form. The main components of ablation products are clusters that form during flight of ablation products and as a result of separation of SiOx-clusters from the zone of the irradiation channel. The roughness and density of the films depend on the heating temperature of the target surface and the type of deposited clusters.
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