Review for High-purity Quartz (SiO2) (Part Ⅱ): Activation and Separation of Lattice Impurities

Autor: Min Lin, Qian Jia, Ziyuan Liu, Yan Wei, Bin Liu, Yu Meng, Hang Qiu, Shunqiu Xu, Shaomin Lei
Jazyk: čínština
Rok vydání: 2022
Předmět:
Zdroj: Kuangchan zonghe liyong, Vol 43, Iss 6, Pp 21-25 (2022)
Druh dokumentu: article
ISSN: 1000-6532
DOI: 10.3969/j.issn.1000-6532.2022.06.004
Popis: High-purity quartz, famous for low impurities and high purity, has been widely used in optical fiber communication, photovoltaic, aerospace, semiconductor display and other high-tech industries. The trace metal and nonmetallic elements (H, Li, B, Na, Al, P, K, Ca, Fe, Ti, etc.) widely occurring in quartz crystal structure are closely bound by Si-O-Si bond, which is difficult to be separated by conventional mineral processing technology. In this paper, the occurrence mechanism of trace elements bound by lattice in high-purity quartz is described in detail, and the advanced separation technology of trace elements in the crystal structure of high-quality quartz in the world is comprehensively and systematically summarized. Based on the research progress of the basic theory of high-purity quartz in China in recent years, some reasonable scientific suggestions on the basic theory of impurity separation of high-purity quartz lattice in China are put forward.
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