Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films—Implications for Structural Studies

Autor:	Yu-Jen Chou, Konstantin B. Borisenko, Partha Pratim Das, Stavros Nicolopoulos, Mauro Gemmi, Angus I. Kirkland
Jazyk:	angličtina
Rok vydání:	2023
Předmět:	transmission electron microscopy precession electron diffraction amorphous silica reduced density function pair distribution function Mathematics QA1-939
Zdroj:	Symmetry, Vol 15, Iss 7, p 1291 (2023)
Druh dokumentu:	article
ISSN:	2073-8994
DOI:	10.3390/sym15071291
Popis:	We investigated the influence of precession angle, energy filtering and sample thickness on the structural parameters of amorphous SiO2 thin films from the electron reduced density functions obtained by applying precession electron diffraction. The results demonstrate that the peak positions in the electron reduced density functions are generally insensitive to the studied experimental conditions, while both precession angle and energy filtering influence peak heights considerably. It is also shown that introducing precession with small angles of up to 2 degrees and energy filtering results in higher coordination numbers that are closer to the expected theoretical values of 4 and 2 for Si and O, respectively, for data obtained from a thicker sample.
Databáze:	Directory of Open Access Journals
Externí odkaz:	https://doaj.org/article/05ab58ca82254e79ab5f1c3b98a5d5be Zobrazit plný text záznamu View record in DOAJ Plný text ve formátu PDF Plný text ve formátu HTML
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