| Autor: |
Eric R. Fossum |
| Jazyk: |
angličtina |
| Rok vydání: |
2022 |
| Předmět: |
|
| Zdroj: |
IEEE Journal of the Electron Devices Society, Vol 10, Pp 269-274 (2022) |
| Druh dokumentu: |
article |
| ISSN: |
2168-6734 |
| DOI: |
10.1109/JEDS.2022.3157785 |
| Popis: |
Estimation of the analog read noise level and quantizer threshold level to within a few hundredths of an electron can be obtained by measuring the output bit density, D, of a single-bit quanta image sensor (1bQIS) as a function of quanta exposure, H. Analysis of the D-H characteristics as a function of read noise and quantizer threshold levels is performed and a procedure for extraction of estimated read noise and quantizer threshold is suggested and demonstrated. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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