| Popis: |
The Cu/Sn58Bi/Cu and Cu/Sn58Bi-0.6B4C/Cu joints were prepared by transient liquid phase (TLP) bonding technology to verify the reliability of low-temperature connection joints. Intermetallic compound (IMC) evolution at the interface under different isothermal aging times was analyzed, and the mechanical properties of the joints were tested. The results show that two kinds of IMC, lamellar Cu3Sn and fan-shaped Cu6Sn5, are formed on both sides of the joint. With increasing soldering time, the thickness for both kinds of IMC become thicker, and it is significantly thicker for the IMC near the cold end. Furthermore, the IMC growth rate of the Cu/Sn58Bi-0.6B4C/Cu solder joint is significantly lower. When the isothermal aging time reaches 36 h, the Cu/Sn58Bi/Cu joint has been almost composed of IMC, while it needs a longer time for the Cu/Sn58Bi-0.6B4C/Cu joint. The growth of Cu3Sn IMC is in line with parabolic law, being mainly controlled by volume diffusion near the hot end, while the grain boundary diffusion significantly affects it at the cold end. The joints shear strength decreases gradually with extending bonding time, but it is always higher for the Cu/Sn58Bi-0.6B4C/Cu joint. When the heating time is not long, the fracture mainly appears at the Bi-rich phase in the solder matrix. With increasing bonding time, the location of fracture gradually transformed from the Cu6Sn5 grains to the junction of the two IMC and Cu3Sn grains, along with the intercrystalline fracture and transcrystalline fracture. In summary, B4C nanoparticles can significantly improve the joint reliability and enhance its mechanical properties. |
