| Autor: |
Zagoruiko Yu. A., Kovalenko N. O., Khristyan V. A., Fedorenko O. A., Gerasimenko A. S., Dobrotvorskaya M. V., Mateychenko P. V. |
| Jazyk: |
English<br />Russian |
| Rok vydání: |
2011 |
| Předmět: |
|
| Zdroj: |
Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 3, Pp 35-36 (2011) |
| Druh dokumentu: |
article |
| ISSN: |
2225-5818 |
| Popis: |
A new physical method of Cd1–хZnхTe-detectors passivation is proposed — the treatment of crystal surface by a laser ablation (LA) with subsequent photostimulated passivation (PhSP), during wich a high-resistance oxide layer is formed on it’s surface after the surface cleaning under intensive light irradiation effect. It is shown that the method of LA+PhSP is manufacturable and in comparison with PhSP and PhESP methods developed earlier provides a thick, homogeneous and high-oxide films, which significantly increases the surface resistivity of Cd1–хZnхTe samples and reduces leakage currents in them. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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