Autor: |
R. Fontanini, J. Barbot, M. Segatto, S. Lancaster, Q. Duong, F. Driussi, L. Grenouillet, L. Triozon, J. Coignus, T. Mikolajick, S. Slesazeck, D. Esseni |
Jazyk: |
angličtina |
Rok vydání: |
2022 |
Předmět: |
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Zdroj: |
IEEE Journal of the Electron Devices Society, Vol 10, Pp 593-599 (2022) |
Druh dokumentu: |
article |
ISSN: |
2168-6734 |
DOI: |
10.1109/JEDS.2022.3171217 |
Popis: |
We here report a joint experimental and theoretical analysis of polarization switching in ferroelectric tunnel junctions. Our results show that the injection and trapping of charge into the ferroelectric-dielectric stack has a large influence on the polarization switching. Our results are relevant to the physical understanding and to the design of the devices, and for both memory and memristor applications. |
Databáze: |
Directory of Open Access Journals |
Externí odkaz: |
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