Interplay Between Charge Trapping and Polarization Switching in BEOL-Compatible Bilayer Ferroelectric Tunnel Junctions

Autor: R. Fontanini, J. Barbot, M. Segatto, S. Lancaster, Q. Duong, F. Driussi, L. Grenouillet, L. Triozon, J. Coignus, T. Mikolajick, S. Slesazeck, D. Esseni
Jazyk: angličtina
Rok vydání: 2022
Předmět:
Zdroj: IEEE Journal of the Electron Devices Society, Vol 10, Pp 593-599 (2022)
Druh dokumentu: article
ISSN: 2168-6734
DOI: 10.1109/JEDS.2022.3171217
Popis: We here report a joint experimental and theoretical analysis of polarization switching in ferroelectric tunnel junctions. Our results show that the injection and trapping of charge into the ferroelectric-dielectric stack has a large influence on the polarization switching. Our results are relevant to the physical understanding and to the design of the devices, and for both memory and memristor applications.
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