| Autor: |
Smith, M. C., Leu, A. D., Miyanishi, K., Gely, M. F., Lucas, D. M. |
| Rok vydání: |
2024 |
| Předmět: |
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| Druh dokumentu: |
Working Paper |
| Popis: |
We report the achievement of single-qubit gates with sub-part-per-million error rates, in a trapped-ion $^{43}$Ca$^{+}$ hyperfine clock qubit. We explore the speed/fidelity trade-off for gate times $4.4\leq t_{g}\leq35~\mu$s, and benchmark a minimum error of $1.5(4) \times 10^{-7}$. Gate calibration errors are suppressed to $< 10^{-8}$, leaving qubit decoherence ($T_{2}\approx 70$ s), leakage and measurement as the dominant error contributions. The ion is held above a microfabricated surface-electrode trap which incorporates a chip-integrated microwave resonator for electronic qubit control; the trap is operated at room temperature without magnetic shielding. |
| Databáze: |
arXiv |
| Externí odkaz: |
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