| Autor: |
Khajavi, Soheil, Eghrari, Ali, Shaterzadeh-Yazdi, Zahra, Neshat, Mohammad |
| Rok vydání: |
2024 |
| Předmět: |
|
| Zdroj: |
The 29th Iranian Conference on Optics and Photonics (ICOP 2023) |
| Druh dokumentu: |
Working Paper |
| Popis: |
Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This paper studies two analytical models for the s-SNOM probe using atomic force microscopy (AFM) tip and its interaction with a dielectric material. We evaluate the validity of these models by retrieving the permittivity spectrum of a sample material through an inverse method. |
| Databáze: |
arXiv |
| Externí odkaz: |
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