| Autor: |
Fan, Rundong, Wei, Shili, Qian, Zhuang, Ji, Huiru, Tan, Hao, Mo, Yan, Ma, Donglin |
| Rok vydání: |
2024 |
| Předmět: |
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| Druh dokumentu: |
Working Paper |
| Popis: |
The tolerance analysis of freeform surfaces plays a crucial role in the development of advanced imaging systems. However, the intricate relationship between surface error and imaging quality poses significant challenges, necessitating dense sampling of featured rays during the computation process to ensure an accurate tolerance for different fields of view (FOVs). Here, we propose an adaptive sampling strategy called "Critical Ray Aiming" for surface tolerance analysis. By identifying the most sensitive ray to wave aberration at each surface point, our methodology facilitates flexible sampling of the FOVs and entrance pupil (EP), achieving computational efficiency without compromising accuracy in determining tolerable surface error. We demonstrate the effectiveness of our method through tolerance analysis of two different freeform imaging systems. |
| Databáze: |
arXiv |
| Externí odkaz: |
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