Measurement of exciton fraction of microcavity exciton-polaritons using transfer-matrix modeling
| Autor: | Beaumariage, Jonathan, Sun, Zheng, Alnatah, Hassan, Yao, Qi, Myers, David M., Steger, Mark, West, Ken, Baldwin, Kirk, Pfeiffer, Loren N., Tam, Man Chun Alan, Wailewski, Zbig R., Snoke, David W. |
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| Rok vydání: | 2024 |
| Předmět: | |
| Druh dokumentu: | Working Paper |
| Popis: | We present a careful calibration of the exciton fraction of polaritons in high-$Q$ ($\sim 300,000$), long-lifetime ($\sim 300$ ps), GaAs/AlGaAs microcavities.This is a crucial parameter for many-body theories which include the polariton-polariton interactions.It is much harder to establish this number in high-$Q$ structures compared to low-$Q$ structures, because the upper polariton is nearly invisible in high-$Q$ cavities.We present a combination of photoluminescence, photoluminescence excitation, and reflectivity measurements to highly constrain the fit model, and compare the results of this model to the results from low-$Q$ structures.We present a fitted curve of exciton fraction as a function of the lower polariton energy for multiple samples which have been used in prior experiments. Comment: 16 pages, 11 figures |
| Databáze: | arXiv |
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