White-box validation of quantitative product lines by statistical model checking and process mining

Autor: Casaluce, Roberto, Burattin, Andrea, Chiaromonte, Francesca, Lafuente, Alberto Lluch, Vandin, Andrea
Rok vydání: 2024
Předmět:
Druh dokumentu: Working Paper
Popis: We propose a novel methodology for validating software product line (PL) models by integrating Statistical Model Checking (SMC) with Process Mining (PM). Our approach focuses on the feature-oriented language QFLan in the PL engineering domain, allowing modeling of PLs with rich cross-tree and quantitative constraints, as well as aspects of dynamic PLs like staged configurations. This richness leads to models with infinite state-space, requiring simulation-based analysis techniques like SMC. For instance, we illustrate with a running example involving infinite state space. SMC involves generating samples of system dynamics to estimate properties such as event probabilities or expected values. On the other hand, PM uses data-driven techniques on execution logs to identify and reason about the underlying execution process. In this paper, we propose, for the first time, applying PM techniques to SMC simulations' byproducts to enhance the utility of SMC analyses. Typically, when SMC results are unexpected, modelers must determine whether they stem from actual system characteristics or model bugs in a black-box manner. We improve on this by using PM to provide a white-box perspective on the observed system dynamics. Samples from SMC are fed into PM tools, producing a compact graphical representation of observed dynamics. The mined PM model is then transformed into a QFLan model, accessible to PL engineers. Using two well-known PL models, we demonstrate the effectiveness and scalability of our methodology in pinpointing issues and suggesting fixes. Additionally, we show its generality by applying it to the security domain.
Comment: Pre-print Special Issue on Managing Variability in Complex Software-Intensive Systems of the Journal of Systems and Software
Databáze: arXiv