MEC: An Open-source Fine-grained Mapping Equivalence Checking Tool for FPGA

Autor:	Ni, Liwei, Yang, Zonglin, Zhang, Jiaxi, Feng, Changhong, Liu, Jianhua, Luo, Guojie, Li, Huawei, Xie, Biwei, Li, Xingquan
Rok vydání:	2023
Předmět:	Computer Science - Hardware Architecture
Druh dokumentu:	Working Paper
Popis:	Technology mapping is an essential step in EDA flow. However, the function of the circuit may be changed after technology mapping, and equivalence checking (EC) based verification is highly necessary. The traditional EC method has significant time and resource constraints, making it only feasible to carry out at a coarse-grained level. To make it efficient for technology mapping, we propose a fine-grained method called MEC, which leverages a combination of two approaches to significantly reduce the time cost of verification. The local block verification approach performs fast verification and the global graph cover approach guarantees correctness. The proposed method is rigorously tested and compared to three EC tools, and the results show that MEC technique offers a substantial improvement in speed. MEC not only offers a faster and more efficient way of performing EC on technology mapping but also opens up new opportunities for more fine-grained verification in the future. Comment: International Symposium of EDA 2023
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/2312.14541 Zobrazit plný text záznamu View this record from Arxiv