Simulating the secondary electron avalanche of MCP by Geant4
| Autor: | Peng, Huaxing, Yan, Baojun, Miao, Han, Liu, Shulin, Zhang, Binting |
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| Rok vydání: | 2023 |
| Předmět: | |
| Zdroj: | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 1062 (2024) 169163 |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1016/j.nima.2024.169163 |
| Popis: | Nowadays, Microchannel Plate (MCP), as a kind of electron multipliers based on the secondary electron emission, is widely used in many high-sensitive experiments, such as neutrino detection, which require the noise to be as low as possible, while the conventional straight-channel MCP will inevitably have ion feedback, resulting in the sequential after-pulses being the major source of noise. Normally, the problem can be effectively avoided by coupling two straight-channel MCPs in cascade and combining the channels into a `V` shape known as chevron MCPs, but this method is limited by the manufacturing techniques due to the unavoidable gap between the two pieces that will worsen the resolution and peak-to-valley ratio. However, the ion feedback can be inhibited significantly for MCPs with curved channels. Based on Geant4, we investigate how the geometrical parameters of curved-channel MCP influence the gain and get the optimum pore diameter for an MCP to reach the maximum gain with fixed thickness and applied voltage. Additionally, the track-by-track simulation reveals that the average acceleration distance of a secondary electron inside the curved-channel is approximately 20 um when the applied voltage, length-to-diameter ratio and pore diameter are 950 V, 50:1 and 20 um, respectively. Comment: 29 pages, 14 figures |
| Databáze: | arXiv |
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