Biaxial Tensile Strain Enhances Electron Mobility of Monolayer Transition Metal Dichalcogenides

Autor: Yang, Jerry A., Bennett, Robert K. A., Hoang, Lauren, Zhang, Zhepeng, Thompson, Kamila J., Michail, Antonios, Parthenios, John, Papagelis, Konstantinos, Mannix, Andrew J., Pop, Eric
Rok vydání: 2023
Předmět:
Druh dokumentu: Working Paper
DOI: 10.1021/acsnano.3c08996
Popis: Strain engineering can modulate the material properties of two-dimensional (2D) semiconductors for electronic and optoelectronic applications. Recent theory and experiments have found that uniaxial tensile strain can improve the electron mobility of monolayer MoS$_2$, a 2D semiconductor, but the effects of biaxial strain on charge transport are not well-understood in 2D semiconductors. Here, we use biaxial tensile strain on flexible substrates to probe the electron mobility in monolayer WS$_2$ and MoS$_2$ transistors. This approach experimentally achieves ~2x higher on-state current and mobility with ~0.3% applied biaxial strain in WS$_2$, the highest mobility improvement at the lowest strain reported to date. We also examine the mechanisms behind this improvement through density functional theory simulations, concluding that the enhancement is primarily due to reduced intervalley electron-phonon scattering. These results underscore the role of strain engineering 2D semiconductors for flexible electronics, sensors, integrated circuits, and other optoelectronic applications.
Comment: Corrected author list
Databáze: arXiv