A Novel Fault-Tolerant Logic Style with Self-Checking Capability

Autor:	Taheri, Mahdi, Sheikhpour, Saeideh, Mahani, Ali, Jenihhin, Maksim
Rok vydání:	2023
Předmět:	Computer Science - Hardware Architecture Computer Science - Artificial Intelligence Electrical Engineering and Systems Science - Systems and Control
Druh dokumentu:	Working Paper
DOI:	10.1109/IOLTS56730.2022.9897818
Popis:	We introduce a novel logic style with self-checking capability to enhance hardware reliability at logic level. The proposed logic cells have two-rail inputs/outputs, and the functionality for each rail of outputs enables construction of faulttolerant configurable circuits. The AND and OR gates consist of 8 transistors based on CNFET technology, while the proposed XOR gate benefits from both CNFET and low-power MGDI technologies in its transistor arrangement. To demonstrate the feasibility of our new logic gates, we used an AES S-box implementation as the use case. The extensive simulation results using HSPICE indicate that the case-study circuit using on proposed gates has superior speed and power consumption compared to other implementations with error-detection capability Comment: 6 pages, 3 tables, 5 figures
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/2306.00844 Zobrazit plný text záznamu View this record from Arxiv