| Autor: |
Singh, Siddharth, Liu, He, Arora, Rajat, Suter, Robert M., Acharya, Amit |
| Rok vydání: |
2023 |
| Předmět: |
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| Druh dokumentu: |
Working Paper |
| Popis: |
A rigorous methodology is developed for computing elastic fields generated by experimentally observed defect structures within grains in a polycrystal that has undergone tensile extension. An example application is made using a near-field High Energy X-ray Diffraction Microscope measurement of a zirconium sample that underwent $13.6\%$ tensile extension from an initially well-annealed state. (Sub)grain boundary features are identified with apparent disclination line defects in them. The elastic fields of these features identified from the experiment are calculated. |
| Databáze: |
arXiv |
| Externí odkaz: |
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