Thin Film Rupture from the Atomic Scale

Autor: Rahman, Muhammad Rizwanur, Shen, Li, Ewen, James P., Collard, Benjamin, Heyes, D. M., Dini, Daniele, Smith, E. R.
Rok vydání: 2022
Předmět:
Druh dokumentu: Working Paper
DOI: 10.1063/5.0149974
Popis: The retraction of thin films, as described by the Taylor-Culick (TC) theory, is subject to widespread debate, particularly for films at the nanoscale. We use non-equilibrium molecular dynamics simulations to explore the validity of the assumptions used in continuum models, by tracking the evolution of holes in a film. By deriving a new mathematical form for the surface shape and considering a locally varying surface tension at the front of the retracting film, we reconcile the original theory with our simulation data to recover a corrected TC speed valid at the nanoscale.
Databáze: arXiv