High-speed processing of X-ray wavefront marking data with the Unified Modulated Pattern Analysis (UMPA) model

Autor:	De Marco, Fabio, Savatović, Sara, Smith, Ronan, Di Trapani, Vittorio, Margini, Marco, Lautizi, Ginevra, Thibault, Pierre
Rok vydání:	2022
Předmět:	Physics - Medical Physics Electrical Engineering and Systems Science - Image and Video Processing Physics - Computational Physics
Druh dokumentu:	Working Paper
DOI:	10.1364/OE.474794
Popis:	Wavefront-marking X-ray imaging techniques use e.g., sandpaper or a grating to generate intensity fluctuations, and analyze their distortion by the sample in order to retrieve attenuation, phase-contrast, and dark-field information. Phase contrast yields an improved visibility of soft-tissue specimens, while dark-field reveals small-angle scatter from sub-resolution structures. Both have found many biomedical and engineering applications. The previously developed Unified Modulated Pattern Analysis (UMPA) model extracts these modalities from wavefront-marking data. We here present a new UMPA implementation, capable of rapidly processing large datasets and featuring capabilities to greatly extend the field of view. We also discuss possible artifacts and additional new features. Comment: 18 pages, 7 figures, submitted to Optics Express
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/2211.01375 Zobrazit plný text záznamu View this record from Arxiv