Measuring Noise Parameters Using an Open, Short, Load, and 1/8-wavelength Cable as Source Impedances
| Autor: | Price, Danny C., Tong, Cheuk-Yu Edward, Sutinjo, Adrian T., Greenhill, Lincoln J., Patra, Nipanjana |
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| Rok vydání: | 2022 |
| Předmět: | |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1109/TMTT.2022.3225317 |
| Popis: | Noise parameters are a set of four measurable quantities which determine the noise performance of a radio-frequency device under test. The noise parameters of a 2-port device can be extracted by connecting a set of 4 or more source impedances at the device's input, measuring the noise power of the device with each source connected, and then solving a matrix equation. However, sources with high reflection coefficients cannot be used due to a singularity that arises in entries of the matrix. Here, we detail a new method of noise parameter extraction using a singularity-free matrix that is compatible with high-reflection sources. We show that open, short, load and an open cable ("OSLC") can be used to extract noise parameters, and we detail a practical measurement approach. The OSLC approach is particularly well-suited for low-noise amplifier measurement at frequencies below 1 GHz, where alternative methods require physically large apparatus. Comment: IEEE Transactions on Microwave Theory and Techniques |
| Databáze: | arXiv |
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