| Autor: |
Rieger, D., Günzler, S., Spiecker, M., Nambisan, A., Wernsdorfer, W., Pop, I. M. |
| Rok vydání: |
2022 |
| Předmět: |
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| Zdroj: |
Phys. Rev. Applied 20, 014059 (2023) |
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1103/PhysRevApplied.20.014059 |
| Popis: |
Resonator measurements are a simple but powerful tool to characterize a material's microwave response. The losses of a resonant mode are quantified by its internal quality factor $Q_\mathrm{i}$, which can be extracted from the scattering coefficient in a microwave reflection or transmission measurement. Here we show that a systematic error on $Q_\mathrm{i}$ arises from Fano interference of the signal with a background path. Limited knowledge of the interfering paths in a given setup translates into a range of uncertainty for $Q_\mathrm{i}$, which increases with the coupling coefficient. We experimentally illustrate the relevance of Fano interference in typical microwave resonator measurements and the associated pitfalls encountered in extracting $Q_\mathrm{i}$. On the other hand, we also show how to characterize and utilize the Fano interference to eliminate the systematic error. |
| Databáze: |
arXiv |
| Externí odkaz: |
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