| Autor: |
Kim, Se-Ho, Dong, Kang, Zhao, Huan, El-Zoka, Ayman A., Zhou, Xuyang, Woods, Eric V., Giuliani, Finn, Manke, Ingo, Raabe, Dierk, Gault, Baptiste |
| Rok vydání: |
2022 |
| Předmět: |
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| Druh dokumentu: |
Working Paper |
| Popis: |
Si-anodes have long been candidates thanks to an expected ten-fold increase in capacity compared to graphite. However, details of the mechanisms governing their degradation remain elusive, hindering science-guided development of long-lived Si-based anodes. Here we demonstrate how the latest developments in cryo-atom probe tomography enable the in-depth analysis of the electrode and electrolyte, and their interface at atomic-level. |
| Databáze: |
arXiv |
| Externí odkaz: |
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