Surface recombination and space-charge-limited photocurrent-voltage (PC-V) measurements in (Cd,Mn)Te samples. Kinetics of photocurrent (PC)
| Autor: | Mycielski, Andrzej, Kochanowska, Dominika M., Wardak, Aneta, Goscinski, Krzysztof, Szot, Michal, Dobrowolski, Witold, Janusz, Gabriela, Gorska, Malgorzata, Janiak, Lukasz, Czarnacki, Wieslaw, Swiderski, Lukasz, Iwanowska-Hanke, Joanna, Moszynski, Marek |
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| Rok vydání: | 2022 |
| Předmět: | |
| Zdroj: | Sensors 22 (2022) 2941 |
| Druh dokumentu: | Working Paper |
| DOI: | 10.3390/s22082941 |
| Popis: | Photocurrent-voltage characteristic (PC-V) is a method of determining the critical parameter in X-ray and gamma-ray detector plates, i.e., the carrier mobility - lifetime product, mt. We show on the (Cd,Mn)Te samples that the measurement results depend strongly on the surface treatment and the charge space distribution. The PC-V characteristics obtained for hv > Eg and hv ~ Eg indicated that etching with 20% HCl caused an appearance of a significant concentration of very shallow surface traps at the (Cd,Mn)Te sample surface. These traps seriously changed the measurements of PC-V characteristics and PC kinetics. We also noticed a small contribution of holes to photoconductivity in the PC kinetics. The PC-V characteristics measurements for hv > Eg may test the detector plate surface quality. Comment: 16 pages, 13 figures |
| Databáze: | arXiv |
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