Swap Test with Quantum-Dot Charge Qubits

Autor: Li, Y. -D., Barraza, N., Barrios, G. Alvarado, Solano, E., Albarrán-Arriagada, F.
Rok vydání: 2021
Předmět:
Zdroj: Phys. Rev. Applied 18, 014047 (2022)
Druh dokumentu: Working Paper
DOI: 10.1103/PhysRevApplied.18.014047
Popis: We propose the implementation of the Swap Test using a charge qubit in a double quantum dot. The Swap Test is a fundamental quantum subroutine in quantum machine learning and other applications for estimating the fidelity of two unknown quantum states by measuring an auxiliary qubit. Our proposal uses a controlled three-qubit gate which is natural to quantum-dot charge qubits. It allows us to implement a Swap Test with a circuit depth of six layers, and an estimated gate time of less than 3 ns, that is below the coherence time of double quantum dots. This work paves the way for enhancing the toolbox of quantum machine learning developments in semiconductor qubits.
Comment: 6 Pages, 9 Figures
Databáze: arXiv