HEMT-based 1K front-end electronics for the heat and ionization Ge CryoCube of the future RICOCHET CE$\nu$NS experiment

Autor: Baulieu, G., Billard, J., Bres, G., Bret, J-L, Chaize, D., Colas, J., Dong, Q., Exshaw, O., Guerin, C., Ferriol, S., Filippini, J-B, De Jesus, M., Jin, Y., Juillard, A., Lamblin, J., Lattaud, H., Minet, J., Misiak, D., Monfardini, A., Rarbi, F., Salagnac, T., Vagneron, L., Collaboration, the RICOCHET
Rok vydání: 2021
Předmět:
Zdroj: Journal of Low Temperature Physics 209, pages 570-580 (2022)
Druh dokumentu: Working Paper
DOI: 10.1007/s10909-022-02896-5
Popis: The RICOCHET reactor neutrino observatory is planned to be installed at the Laue Langevin Institute (ILL) starting mid-2022. Its scientific goal is to perform a low-energy and high precision measurement of the coherent elastic neutrino-nucleus scattering (CE$\nu$NS) spectrum in order to explore exotic physics scenarios. RICOCHET will host two cryogenic detector arrays: the CryoCube (Ge target) and the Q-ARRAY (Zn target), operated at 10 mK. The 1 kg Ge CryoCube will consist of 27 Ge crystals instrumented with NTD-Ge thermal sensors and charge collection electrodes for a simultaneous heat and ionization readout to reject the electromagnetic backgrounds (gamma, beta, x-rays). We present the status of its front-end electronics. The first stage of amplification is made of High Electron Mobility Transistor (HEMT) developed by CNRS/C2N laboratory, optimized to achieve ultra-low noise performance at 1K with a dissipation as low as 15 $\mu$W per channel. Our noise model predicts that 10 eV heat and 20 eVee RMS baseline resolutions are feasible with a high dynamic range for the deposited energy (up to 10 MeV) thanks to loop amplification schemes. Such resolutions are mandatory to have a high discrimination power between nuclear and electron recoils at the lowest energies.
Comment: submitted to Journal of Low Temperature Physics. Special Issue for the 19th International Workshop on Low Temperature Detectors 19-29 July 2021 - Virtual event hold by NIST
Databáze: arXiv
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