An Automated Scanning Transmission Electron Microscope Guided by Sparse Data Analytics
| Autor: | Olszta, Matthew, Hopkins, Derek, Fiedler, Kevin R., Oostrom, Marjolein, Akers, Sarah, Spurgeon, Steven R. |
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| Rok vydání: | 2021 |
| Předmět: | |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1017/S1431927622012065 |
| Popis: | Artificial intelligence (AI) promises to reshape scientific inquiry and enable breakthrough discoveries in areas such as energy storage, quantum computing, and biomedicine. Scanning transmission electron microscopy (STEM), a cornerstone of the study of chemical and materials systems, stands to benefit greatly from AI-driven automation. However, present barriers to low-level instrument control, as well as generalizable and interpretable feature detection, make truly automated microscopy impractical. Here, we discuss the design of a closed-loop instrument control platform guided by emerging sparse data analytics. We demonstrate how a centralized controller, informed by machine learning combining limited $a$ $priori$ knowledge and task-based discrimination, can drive on-the-fly experimental decision-making. This platform unlocks practical, automated analysis of a variety of material features, enabling new high-throughput and statistical studies. Comment: 28 pages, 3 figures |
| Databáze: | arXiv |
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