High Aspect Ratio Transition Edge Sensors for X-ray Spectrometry
Autor: | de Wit, M., Gottardi, L., Taralli, E., Nagayoshi, K., Ridder, M. L., Akamatsu, H., Bruijn, M. P., D'Andrea, M., van der Kuur, J., Ravensberg, K., Vaccaro, D., Visser, S., Gao, J. R., Herder, J. -W. A. den |
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Rok vydání: | 2021 |
Předmět: | |
Zdroj: | Journal of Applied Physics 128, 224501 (2020) |
Druh dokumentu: | Working Paper |
DOI: | 10.1063/5.0029669 |
Popis: | We are developing large TES arrays in combination with FDM readout for the next generation of X-ray space observatories. For operation under AC-bias, the TESs have to be carefully designed and optimized. In particular, the use of high aspect ratio devices will help to mitigate non-ideal behaviour due to the weak-link effect. In this paper, we present a full characterization of a TES array containing five different device geometries, with aspect ratios (width:length) ranging from 1:2 up to 1:6. The complex impedance of all geometries is measured in different bias configurations to study the evolution of the small-signal limit superconducting transition parameters, as well as the excess noise. We show that high aspect ratio devices with properly tuned critical temperatures (around 90 mK) can achieve excellent energy resolution, with an array average of 2.03 +- 0.17 eV at 5.9 keV and a best achieved resolution of 1.63 +- 0.17 eV. This demonstrates that AC-biased TESs can achieve a very competitive performance compared to DC-biased TESs. The results have motivated a push to even more extreme device geometries currently in development. Comment: 11 pages, 10 figures |
Databáze: | arXiv |
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