Direct observation of layer-stacking and oriented wrinkles in multilayer hexagonal boron nitride
| Autor: | Chen, Lingxiu, Elibol, Kenan, Cai, Haifang, Jiang, Chengxin, Shi, Wenhao, Chen, Chen, Wang, Hui Shan, Wang, Xiujun, Mu, Xiaojing, Li, Chen, Watanabe, Kenji, Taniguchi, Takashi, Guo, Yufeng, Meyer, Jannik C., Wang, Haomin |
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| Rok vydání: | 2021 |
| Předmět: | |
| Zdroj: | 2D Materials 2021, 8, 024001 |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1088/2053-1583/abd41e |
| Popis: | Hexagonal boron nitride (h-BN) has long been recognized as an ideal substrate for electronic devices due to its dangling-bond-free surface, insulating nature and thermal/chemical stability. Therefore, to analyse the lattice structure and orientation of h-BN crystals becomes important. Here, the stacking order and wrinkles of h-BN are investigated by transmission electron microscopy (TEM). It is experimentally confirmed that the layers in the h-BN flakes are arranged in the AA' stacking. The wrinkles in a form of threefold network throughout the h-BN crystal are oriented along the armchair direction, and their formation mechanism was further explored by molecular dynamics simulations. Our findings provide a deep insight about the microstructure of h-BN and shed light on the structural design/electronic modulations of two-dimensional crystals. Comment: 7 pages, 5 figures |
| Databáze: | arXiv |
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