| Autor: |
Myers, Daniel, Espenlaub, Andrew, Gelzinyte, Kristina, Young, Erin, Martinelli, Lucio, Peretti, Jacques, Weisbuch, Claude, Speck, James |
| Rok vydání: |
2020 |
| Předmět: |
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| Zdroj: |
Applied Physics Letters, American Institute of Physics, 2020, 116 (9), pp.091102 |
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1063/1.5125605 |
| Popis: |
We report on the direct measurement of hot electrons generated in the active region of blue light-emitting diodes grown by ammonia molecular beam epitaxy by electron emission spectroscopy. The external quantum efficiency of these devices is <1% and does not droop; thus, the efficiency losses from the intrinsic, interband, electron-electron-hole, or electron-hole-hole Auger should not be a significant source of hot carriers. The detection of hot electrons in this case suggests that an alternate hot electron generating process is occurring within these devices, likely a trap-assisted Auger recombination process. |
| Databáze: |
arXiv |
| Externí odkaz: |
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