Thermal stability for domain wall mediated magnetization reversal in perpendicular STT MRAM cells with W insertion layers
| Autor: | Mihajlovic, G., Smith, N., Santos, T., Li, J., Terris, B. D., Katine, J. A. |
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| Rok vydání: | 2020 |
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| Druh dokumentu: | Working Paper |
| DOI: | 10.1063/5.0023852 |
| Popis: | We present an analytical model for calculating energy barrier for the magnetic field-driven domain wall-mediated magnetization reversal of a magneto-resistive random access memory (MRAM) cell and apply it to study thermal stability factor $\Delta$ for various thicknesses of W layers inserted into the free layer (FL) as a function of the cell size and temperature. We find that, by increasing W thickness, the effective perpendicular magnetic anisotropy (PMA) energy density of the FL film monotonically increases, but at the same time, $\Delta$ of the cell mainly decreases. Our analysis shows that, in addition to saturation magnetization $M_s$ and exchange stiffness constant $A_\mathrm{ex}$ of the FL film, the parameter that quantifies the $\Delta$ of the cell is its coercive field $H_c$, rather than the net PMA field $H_k$ of the FL film comprising the cell. Comment: 8 pages, supplementary material included |
| Databáze: | arXiv |
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