Total internal reflection based super-resolution imaging for sub-IR frequencies

Autor:	Barr, Lauren E., Karlsen, Peter, Hornett, Samuel M., Hooper, Ian R., Mrnka, Michal, Lawrence, Christopher R., Phillips, David B., Hendry, Euan
Rok vydání:	2020
Předmět:	Physics - Applied Physics Physics - Instrumentation and Detectors Physics - Optics
Druh dokumentu:	Working Paper
Popis:	For measurements designed to accurately determine layer thickness, there is a natural trade-off between sensitivity to optical thickness and lateral resolution due to the angular ray distribution required for a focused beam. We demonstrate a near-field imaging approach that enables both sub-wavelength lateral resolution and optical thickness sensitivity. We illuminate a sample in a total internal reflection geometry, with a photo-activated spatial modulator in the near-field, which allows optical thickness images to be computationally reconstructed in a few seconds. We demonstrate our approach at 140 GHz (wavelength 2.15 mm), where images are normally severely limited in spatial resolution, and demonstrate mapping of optical thickness variation in inhomogeneous biological tissues. Comment: Main text has 13 pages & 4 figures
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/2006.02091 Zobrazit plný text záznamu View this record from Arxiv