Electron spectrometry with SDDs: a GEANT4 based method for detector response reconstruction
Autor: | Biassoni, Matteo, Gugiatti, Matteo, Capelli, Silvia, Carminati, Marco, Cremonesi, Oliviero, Fiorini, Carlo, Lechner, Peter, Mertens, Susanne, Pagnanini, Lorenzo, Pavan, Maura, Pozzi, Stefano |
---|---|
Rok vydání: | 2020 |
Předmět: | |
Druh dokumentu: | Working Paper |
Popis: | Electron spectrometry is traditionally challenging due to the difficulty of correctly reconstructing the original energy of the detected electrons. Silicon Drift Detectors, extensively used for X-ray spectrometry, are a promising technology for the precise measurement of electrons energy. The ability to correctly model the detector entrance window response to the energy deposited by electrons is a critical aspect of this application. We hereby describe a MonteCarlo-based approach to this problem, together with characterization and validation measurements performed with electron beams from a Scanning Electron Microscope. Comment: 7 pages, 8 figures |
Databáze: | arXiv |
Externí odkaz: |