| Autor: |
Lange, Thomas, Glorieux, Maximilien, Alexandrescu, Dan, Sterpone, Luca |
| Rok vydání: |
2020 |
| Předmět: |
|
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1109/DTIS.2019.8735052 |
| Popis: |
With technology scaling, lower supply voltages, and higher operating frequencies clock distribution networks become more and more vulnerable to transients faults. These faults can cause circuit-wide effects and thus, significantly contribute to the functional failure rate of the circuit. This paper proposes a methodology to analyse how the functional behaviour is affected by Single-Event Transients in the clock distribution network. The approach is based on logic-level simulation and thus, only uses the register-transfer level description of a design. Therefore, a fault model is proposed which implements the main effects due to radiation-induced transients in the clock network. This fault model enables the computation of the functional failure rate caused by Single-Event Transients for each individual clock buffer, as well as the complete network. Further, it allows the identification of the most vulnerable flip-flops related to Single-Event Transients in the clock network. The proposed methodology is applied in a practical example and a fault injection campaign is performed. In order to evaluate the impact of Single-Event Transients in clock distribution networks, the obtained functional failure rate is compared to the error rate caused by Single-Event Upsets in the sequential logic. |
| Databáze: |
arXiv |
| Externí odkaz: |
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