Correlated and in-situ electrical transmission electron microscopy studies and related membrane fabrication
| Autor: | Spies, Maria, Sadre-Momtaz, Zahra, Lähnemann, Jonas, Luong, Minh Anh, Fernandez, Bruno, Fournier, Thierry, Monroy, Eva, Hertog, Martien I. den |
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| Rok vydání: | 2020 |
| Předmět: | |
| Zdroj: | Nanotechnology 31, 472001 (2020) |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1088/1361-6528/ab99f0 |
| Popis: | Understanding the interplay between the structure, composition and opto-electronic properties of semiconductor nano-objects requires combining transmission electron microscopy (TEM) based techniques with electrical and optical measurements on the very same specimen. Recent developments in TEM technologies allow not only the identification and in-situ electrical characterization of a particular object, but also the direct visualization of its modification in-situ by techniques such as Joule heating. Over the past years, we have carried out a number of studies in these fields that are reviewed in this contribution. In particular, we discuss here i) correlated studies where the same unique object is characterized electro-optically and by TEM, ii) in-situ Joule heating studies where a solid-state metal-semiconductor reaction is monitored in the TEM, and iii) in-situ biasing studies to better understand the electrical properties of contacted single nanowires. In addition, we provide detailed fabrication steps for the silicon nitride membranes crucial to these correlated and in-situ measurements. Comment: This is an author-created, un-copyedited version of a topical review published in Nanotechnology. IOP Publishing Ltd. is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at https://doi.org/10.1088/1361-6528/ab99f0 |
| Databáze: | arXiv |
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