Pitfalls and prospects of optical spectroscopy to characterize perovskite-transport layer interfaces

Autor: Hutter, Eline M., Kirchartz, Thomas, Ehrler, Bruno, Cahen, David, von Hauff, Elizabeth
Rok vydání: 2019
Předmět:
Zdroj: Applied Physics Letters 116, 100501 (2020)
Druh dokumentu: Working Paper
DOI: 10.1063/1.5143121
Popis: Perovskite photovoltaics has witnessed an unprecedented increase in power conversion efficiency over the last decade. The choice of transport layers, through which photo-generated electrons and holes are transported to the electrodes, is a crucial factor for further improving both the device performance and stability. In this perspective, we critically examine the application of optical spectroscopy to characterize the quality of the transport layer-perovskite interface. We highlight the power of complementary studies that use both continuous wave (cw) and time-resolved photoluminescence (PL) to understand non-radiative losses, and additional transient spectroscopies for characterizing the potential for loss-less carrier extraction at the solar cell interfaces. Based on this discussion, we make recommendations on how to extrapolate results from optical measurements to assess the quality of a transport layer, and its impact on solar cell efficiency.
Databáze: arXiv