Surface scaling behaviour of size-selected Ag-nanocluster film growing under subsequent shadowing process

Autor:	Barman, Pintu, Deka, Anindita, Mondal, Shyamal, Chowdhury, Debasree, Bhattacharyya, Satyaranjan
Rok vydání:	2019
Předmět:	Condensed Matter - Materials Science
Druh dokumentu:	Working Paper
DOI:	10.1088/1361-6463/ab87c3
Popis:	Surface morphology of size-selected silver nanocluster films grown by dc magnetron sputtering has been investigated by means of an atomic force microscopy (AFM). From the height-height correlation functions ( HHCF) obtained from corresponding AFM images, the scaling exponents are calculated and two types of growth regimes have been observed. In the first regime, the growth exponent is found to be \b{eta}1 = 0.27\pm0.07 close to the KPZ growth exponent, while in the second growth regime shadowing effect plays dominant role which gives the growth exponent value \b{eta}2 = 0.88\pm0.28. On the other hand for the whole deposition regime, the roughness exponent value is found to be constant around {\alpha}= 0.76\pm0.02. UV-vis spectroscopy measurement suggests how the average reflectance of the film surface changes with different growth times. Comment: 13 pages, 9 figures
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/1911.09381 Zobrazit plný text záznamu View this record from Arxiv