Data-driven approach for synchrotron X-ray Laue microdiffraction scan analysis
Autor: | Song, Yintao, Tamura, Nobumichi, Zhang, Chenbo, Karami, Mostafa, Chen, Xian |
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Rok vydání: | 2019 |
Předmět: | |
Zdroj: | Acta Crystallographica Section A 2019 |
Druh dokumentu: | Working Paper |
DOI: | 10.1107/S2053273319012804 |
Popis: | We propose a novel data-driven approach for analyzing synchrotron Laue X-ray microdiffraction scans based on machine learning algorithms. The basic architecture and major components of the method are formulated mathematically. We demonstrate it through typical examples including polycrystalline BaTiO$_3$, multiphase transforming alloys and finely twinned martensite. The computational pipeline is implemented for beamline 12.3.2 at the Advanced Light Source, Lawrence Berkeley National Lab. The conventional analytical pathway for X-ray diffraction scans is based on a slow pattern by pattern crystal indexing process. This work provides a new way for analyzing X-ray diffraction 2D patterns, independent of the indexing process, and motivates further studies of X-ray diffraction patterns from the machine learning prospective for the development of suitable feature extraction, clustering and labeling algorithms. Comment: 29 pages, 25 figures under the second round of review by Acta Crystallographica A |
Databáze: | arXiv |
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