| Autor: |
Morrow, Darien J., Kohler, Daniel D., Zhao, Yuzhou, Jin, Song, Wright, John C. |
| Rok vydání: |
2019 |
| Předmět: |
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| Zdroj: |
Phys. Rev. B 100, 235303 (2019) |
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1103/PhysRevB.100.235303 |
| Popis: |
Triple sum-frequency (TSF) spectroscopy measures multidimensional spectra by resonantly exciting multiple quantum coherences of vibrational and electronic states. In this work we demonstrate pump-TSF-probe spectroscopy in which a pump excites a sample and some time later three additional electric fields generate a probe field which is measured. We demonstrate pump-TSF-probe spectroscopy on polycrystalline, smooth, thin films and spiral nanostructures of both MoS2 and WS2. The pump-TSF-probe spectra are qualitatively similar to the more conventional transient-reflectance spectra. While transient-reflectance sensitivity suffers under low surface coverage, pump-TSF-probe sensitivity is independent of the sample coverage and nanostructure morphologies. Our results demonstrate that pump-TSF-probe is a valuable methodology for studying microscopic material systems. |
| Databáze: |
arXiv |
| Externí odkaz: |
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