| Autor: |
Czudek, Aniela, Hirselandt, Katrin, Kegelmann, Lukas, Al-Ashouri, Amran, Jošt, Marko, Zuo, Weiwei, Abate, Antonio, Korte, Lars, Albrecht, Steve, Dagar, Janardan, Unger, Eva L. |
| Rok vydání: |
2019 |
| Předmět: |
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| Druh dokumentu: |
Working Paper |
| Popis: |
Determination of the device performance parameters of perovskite solar cells is far from trivial as transient effects may cause large discrepancies in current-voltage measurements as a function of scan rate and pre-conditioning. Maximum power point tracking, MPPT, enables to determine the steady-state maximum power conversion efficiency. However, the MPPT does not provide any information on the device performance parameters, which are reliable only if extracted from current-voltage curves collected under steady-state conditions. We show that is possible to determine the shorter settling or delay time suitable to carry out J-V measurements under steady-state conditions by analysis of the transient device response around the MPP. This procedure proves to be more time-efficient than measurement J-V measurements at a variety of scan rates. Furthermore, the generic algorithm presented here can be implemented to assess changes in the dynamic response of devices during long-term device ageing. |
| Databáze: |
arXiv |
| Externí odkaz: |
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