| Autor: |
Geelen, D., Jobst, J., Krasovskii, E. E., van der Molen, S. J., Tromp, R. M. |
| Rok vydání: |
2019 |
| Předmět: |
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| Zdroj: |
Phys. Rev. Lett. 123, 086802 (2019) |
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1103/PhysRevLett.123.086802 |
| Popis: |
In contrast to the in-plane transport electron mean-free path in graphene, the transverse mean-free path has received little attention and is often assumed to follow the 'universal' mean-free path (MFP) curve broadly adopted in surface and interface science. Here we directly measure transverse electron scattering through graphene from 0 to 25 eV above the vacuum level both in reflection using Low Energy Electron Microscopy and in transmission using electron-Volt Transmission Electron Microscopy. From this data, we obtain quantitative MFPs for both elastic and inelastic scattering. Even at the lowest energies, the total MFP is just a few graphene layers and the elastic MFP oscillates with graphene layer number, both refuting the 'universal' curve. A full theoretical calculation taking the graphene band structure into consideration agrees well with experiment, while the key experimental results are reproduced even by a simple optical toy model. |
| Databáze: |
arXiv |
| Externí odkaz: |
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