| Autor: |
Szirmai, P., Márkus, B. G., Chacón-Torres, J. C., Eckerlein, P., Edelthalhammer, K., Englert, J. M., Mundloch, U., Hirsch, A., Hauke, F., Náfrádi, B., Forró, L., Kramberger, C., Pichler, T., Simon, F. |
| Rok vydání: |
2018 |
| Předmět: |
|
| Zdroj: |
Scientific Reports 9, 19480 (2019) |
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1038/s41598-019-55784-6 |
| Popis: |
An efficient route to synthesize macroscopic amounts of graphene is highly desired and a bulk characterization of such samples, in terms of the number of layers, is equally important. We present a Raman spectroscopy-based method to determine the distribution of the number of graphene layers in chemically exfoliated graphene. We utilize a controlled vapor-phase potassium intercalation technique and identify a lightly doped stage, where the Raman modes of undoped and doped few-layer graphene flakes coexist. The spectra can be unambiguously distinguished from alkali doped graphite, and a modeling with the distribution of the layers yields an upper limit of flake thickness of five layers with a significant single-layer graphene content. Complementary statistical AFM measurements on individual few-layer graphene flakes find a consistent distribution of the layer numbers. |
| Databáze: |
arXiv |
| Externí odkaz: |
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