Stable Branched Electron Flow

Autor: Braem, B A, Gold, C, Hennel, S, Röösli, M, Berl, M, Dietsche, W, Wegscheider, W, Ensslin, K., Ihn, T
Rok vydání: 2018
Předmět:
Zdroj: New Journal of Physics 20, (2018) 073015
Druh dokumentu: Working Paper
DOI: 10.1088/1367-2630/aad068
Popis: The pattern of branched electron flow revealed by scanning gate microscopy shows the distribution of ballistic electron trajectories. The details of the pattern are determined by the correlated potential of remote dopants with an amplitude far below the Fermi energy. We find that the pattern persists even if the electron density is significantly reduced such that the change in Fermi energy exceeds the background potential amplitude. The branch pattern is robust against changes in charge carrier density, but not against changes in the background potential caused by additional illumination of the sample.
Comment: Accepted for publication in New Journal of Physics
Databáze: arXiv