| Autor: |
Mercurio, Giuseppe, Makhotkin, Igor A., Milov, Igor, Kim, Young Yong, Zaluzhnyy, Ivan A., Dziarzhytski, Siarhei, Wenthaus, Lukas, Vartanyants, Ivan A., Wurth, Wilfried |
| Rok vydání: |
2018 |
| Předmět: |
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| Druh dokumentu: |
Working Paper |
| DOI: |
10.1088/1367-2630/aafa47 |
| Popis: |
We demonstrate the structural sensitivity and accuracy of the standing wave technique at a high repetition rate free-electron laser, FLASH at DESY in Hamburg, by measuring the photoelectron yield from the surface SiO2 of Mo/Si multilayers. These experiments open up the possibility to obtain unprecedented structural information of adsorbate and surface atoms with picometer spatial accuracy and femtosecond temporal resolution. This technique will substantially contribute to a fundamental understanding of chemical reactions at catalytic surfaces and the structural dynamics of superconductors. |
| Databáze: |
arXiv |
| Externí odkaz: |
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