| Autor: |
Gauquelin, Nicolas, Zhang, Hao, Zhu, Guozhen, Wei, John Y. T., Botton, Gianluigi A. |
| Rok vydání: |
2017 |
| Předmět: |
|
| Druh dokumentu: |
Working Paper |
| Popis: |
We have discovered two novel types of planar defects that appear in heteroepitaxial YBa$_2$Cu$_3$O$_{7-\delta}$ (YBCO123) thin films, grown by pulsed-laser deposition (PLD) either with or without a La$_{2/3}$Ca$_{1/3}$MnO$_3$ (LCMO) overlayer, using the combination of high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) imaging and electron energy loss spectroscopy (EELS) mapping for unambiguous identification. These planar lattice defects are based on the intergrowth of either a BaO plane between two CuO chains or multiple Y-O layers between two CuO$_2$ planes, resulting in non-stoichiometric layer sequences that could directly impact the high-$T_c$ superconductivity. |
| Databáze: |
arXiv |
| Externí odkaz: |
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