Scanning electron microscopy with polarization analysis for multilayered chiral spin textures

Autor:	Lucassen, Juriaan, Kloodt-Twesten, Fabian, Frömter, Robert, Oepen, Hans Peter, Duine, Rembert A., Swagten, Henk J. M., Koopmans, Bert, Lavrijsen, Reinoud
Rok vydání:	2017
Předmět:	Condensed Matter - Mesoscale and Nanoscale Physics Condensed Matter - Materials Science
Druh dokumentu:	Working Paper
DOI:	10.1063/1.4998535
Popis:	We show that scanning electron microscopy with polarization analysis (SEMPA) that is sensitive to both in-plane magnetization components can be used to image the out-of-plane magnetized multi-domain state in multilayered chiral spin textures. By depositing a thin layer of Fe on top of the multilayer we image the underlying out-of-plane domain state through the mapping of its stray fields in the Fe. We also demonstrate that SEMPA can be used to image the domain wall chirality in these systems after milling away the capping layer and imaging the topmost magnetic layer directly. Comment: 12 pages, 3 figures
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/1708.00387 Zobrazit plný text záznamu View this record from Arxiv